A 4kb memory array for MRAM development

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007.

Bibliographic Details
Main Author: Qazi, Masood
Other Authors: John K. DeBrosse and Anantha P. Chandrakasan.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2008
Subjects:
Online Access:http://hdl.handle.net/1721.1/41552
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author Qazi, Masood
author2 John K. DeBrosse and Anantha P. Chandrakasan.
author_facet John K. DeBrosse and Anantha P. Chandrakasan.
Qazi, Masood
author_sort Qazi, Masood
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description Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007.
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spelling mit-1721.1/415522019-04-11T14:25:02Z A 4kb memory array for MRAM development Four kilobyte memory array for Magnetic Random Access Memory development Qazi, Masood John K. DeBrosse and Anantha P. Chandrakasan. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007. This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections. Includes bibliographical references (p. 129-131). The circuits for a A 4kb array of Magnetic Tunnel Junctions (MTJs) have been designed and fabricated in a 0:18¹m CMOS process with three levels of metal. Support circuitry for addressing, reading, writing, and test mode probing enables the characterization of the switching of a thin-film ferromagnetic layer in the MTJs. Specifically, novel mechanisms involving spin-transfer or thermal assistance can be studied and compared to current MRAM designs that switch the MTJ with current-induced magnetic fields. Using this array design, both high speed digital and quasi-static dI/dV experiments can be conducted to investigate the nature of the MTJ resistance hysteresis and process variation in addition to the switching behavior under both polarities of current. by Masood Qazi. M.Eng. 2008-05-19T15:00:13Z 2008-05-19T15:00:13Z 2007 2007 Thesis http://hdl.handle.net/1721.1/41552 220933302 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 131 p. application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science.
Qazi, Masood
A 4kb memory array for MRAM development
title A 4kb memory array for MRAM development
title_full A 4kb memory array for MRAM development
title_fullStr A 4kb memory array for MRAM development
title_full_unstemmed A 4kb memory array for MRAM development
title_short A 4kb memory array for MRAM development
title_sort 4kb memory array for mram development
topic Electrical Engineering and Computer Science.
url http://hdl.handle.net/1721.1/41552
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AT qazimasood fourkilobytememoryarrayformagneticrandomaccessmemorydevelopment
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