Characterization of damping of materials and structures at nanostrain levels

Characterization of damping of materials and structures at nanostrain levels

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Aeronautics and Astronautics, 1990.

Bibliographic Details
Main Author:	Ting, Joseph Ming-Shih
Other Authors:	Edward F. Crawley.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2008
Subjects:	Aeronautics and Astronautics.
Online Access:	http://hdl.handle.net/1721.1/42439

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