Measuring nanometer, three-dimensional motions with light microscopy
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997.
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格式: | Thesis |
语言: | eng |
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Massachusetts Institute of Technology
2008
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在线阅读: | http://hdl.handle.net/1721.1/43398 |
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author | Davis, Charles Quentin |
author2 | Dennis M. Freeman. |
author_facet | Dennis M. Freeman. Davis, Charles Quentin |
author_sort | Davis, Charles Quentin |
collection | MIT |
description | Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997. |
first_indexed | 2024-09-23T13:19:07Z |
format | Thesis |
id | mit-1721.1/43398 |
institution | Massachusetts Institute of Technology |
language | eng |
last_indexed | 2024-09-23T13:19:07Z |
publishDate | 2008 |
publisher | Massachusetts Institute of Technology |
record_format | dspace |
spelling | mit-1721.1/433982019-04-11T01:47:11Z Measuring nanometer, three-dimensional motions with light microscopy Davis, Charles Quentin Dennis M. Freeman. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997. Includes bibliographical references (p. 173-182). by Charles Quentin Davis. Ph.D. 2008-11-07T19:36:51Z 2008-11-07T19:36:51Z 1997 1997 Thesis http://hdl.handle.net/1721.1/43398 37648837 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 182 p. application/pdf Massachusetts Institute of Technology |
spellingShingle | Electrical Engineering and Computer Science Davis, Charles Quentin Measuring nanometer, three-dimensional motions with light microscopy |
title | Measuring nanometer, three-dimensional motions with light microscopy |
title_full | Measuring nanometer, three-dimensional motions with light microscopy |
title_fullStr | Measuring nanometer, three-dimensional motions with light microscopy |
title_full_unstemmed | Measuring nanometer, three-dimensional motions with light microscopy |
title_short | Measuring nanometer, three-dimensional motions with light microscopy |
title_sort | measuring nanometer three dimensional motions with light microscopy |
topic | Electrical Engineering and Computer Science |
url | http://hdl.handle.net/1721.1/43398 |
work_keys_str_mv | AT davischarlesquentin measuringnanometerthreedimensionalmotionswithlightmicroscopy |