Measuring nanometer, three-dimensional motions with light microscopy
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997.
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| Formato: | Thesis |
| Idioma: | eng |
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Massachusetts Institute of Technology
2008
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| Acceso en liña: | http://hdl.handle.net/1721.1/43398 |