Java remote microscope for collaborative inspection of integrated circuits
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997.
| Main Author: | |
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| Other Authors: | |
| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2008
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| Online Access: | http://hdl.handle.net/1721.1/43558 |
| _version_ | 1811074359277649920 |
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| author | Perez, Manuel Joseph |
| author2 | Donald E. Troxel. |
| author_facet | Donald E. Troxel. Perez, Manuel Joseph |
| author_sort | Perez, Manuel Joseph |
| collection | MIT |
| description | Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997. |
| first_indexed | 2024-09-23T09:47:49Z |
| format | Thesis |
| id | mit-1721.1/43558 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T09:47:49Z |
| publishDate | 2008 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/435582019-04-10T23:11:15Z Java remote microscope for collaborative inspection of integrated circuits Perez, Manuel Joseph Donald E. Troxel. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science Electrical Engineering and Computer Science Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997. Includes bibliographical references (leaf 89). by Manuel Perez. M.Eng. 2008-11-07T20:11:54Z 2008-11-07T20:11:54Z 1997 1997 Thesis http://hdl.handle.net/1721.1/43558 38529409 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 223 leaves application/pdf Massachusetts Institute of Technology |
| spellingShingle | Electrical Engineering and Computer Science Perez, Manuel Joseph Java remote microscope for collaborative inspection of integrated circuits |
| title | Java remote microscope for collaborative inspection of integrated circuits |
| title_full | Java remote microscope for collaborative inspection of integrated circuits |
| title_fullStr | Java remote microscope for collaborative inspection of integrated circuits |
| title_full_unstemmed | Java remote microscope for collaborative inspection of integrated circuits |
| title_short | Java remote microscope for collaborative inspection of integrated circuits |
| title_sort | java remote microscope for collaborative inspection of integrated circuits |
| topic | Electrical Engineering and Computer Science |
| url | http://hdl.handle.net/1721.1/43558 |
| work_keys_str_mv | AT perezmanueljoseph javaremotemicroscopeforcollaborativeinspectionofintegratedcircuits |