End-to-end verifiability for optical scan voting systems

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.

Detalhes bibliográficos
Autor principal:	Shen, Emily (Emily Huei-Yi)
Outros Autores:	Ronald L. Rivest.
Formato:	Tese
Idioma:	eng
Publicado em:	Massachusetts Institute of Technology 2009
Assuntos:	Electrical Engineering and Computer Science.
Acesso em linha:	http://hdl.handle.net/1721.1/44729

Internet

http://hdl.handle.net/1721.1/44729