On advancement of high speed atomic force microscope technology
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2008.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2009
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| Online Access: | http://hdl.handle.net/1721.1/45319 |
| _version_ | 1826193909660778496 |
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| author | SooHoo, Kimberly E |
| author2 | Kamal Youcef-Toumi. |
| author_facet | Kamal Youcef-Toumi. SooHoo, Kimberly E |
| author_sort | SooHoo, Kimberly E |
| collection | MIT |
| description | Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2008. |
| first_indexed | 2024-09-23T09:46:53Z |
| format | Thesis |
| id | mit-1721.1/45319 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T09:46:53Z |
| publishDate | 2009 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/453192019-04-12T09:56:55Z On advancement of high speed atomic force microscope technology On the advancement of AFM SooHoo, Kimberly E Kamal Youcef-Toumi. Massachusetts Institute of Technology. Dept. of Mechanical Engineering. Massachusetts Institute of Technology. Dept. of Mechanical Engineering. Mechanical Engineering. Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2008. Includes bibliographical references (p. 47). High speed atomic force microscopy (AFM) is a developing process in which nanoscale objects, such as crystal structures or strands of DNA, can be imaged at rates fast enough to watch processes as they occur. Although current generation AFM is already pivotal in many fields of research and industry, slow scan rates inhibit the imaging of dynamic samples. Much advancement has been made in high speed AFM thus far, yet many subsystems remain to be developed. This thesis outlines the development of a feedback controller for the AFM scanner, as well as the filters designed to attenuate high frequency noise. A comparison of the scan signals and scanner output signals are compared, with and without the controller and filters. Post-data acquisition image processing techniques are also described and compared with raw data. Finally, these techniques are applied to the high speed imaging of calcite etched with hydrochloric acid. by Kimberly E. SooHoo. S.B. 2009-04-29T17:25:12Z 2009-04-29T17:25:12Z 2008 2008 Thesis http://hdl.handle.net/1721.1/45319 314404173 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 47 p. application/pdf Massachusetts Institute of Technology |
| spellingShingle | Mechanical Engineering. SooHoo, Kimberly E On advancement of high speed atomic force microscope technology |
| title | On advancement of high speed atomic force microscope technology |
| title_full | On advancement of high speed atomic force microscope technology |
| title_fullStr | On advancement of high speed atomic force microscope technology |
| title_full_unstemmed | On advancement of high speed atomic force microscope technology |
| title_short | On advancement of high speed atomic force microscope technology |
| title_sort | on advancement of high speed atomic force microscope technology |
| topic | Mechanical Engineering. |
| url | http://hdl.handle.net/1721.1/45319 |
| work_keys_str_mv | AT soohookimberlye onadvancementofhighspeedatomicforcemicroscopetechnology AT soohookimberlye ontheadvancementofafm |