1/f noise and related surface effects in germanium.
Issued also as a Sc.D. thesis in the Dept. of Electrical Engineering, 1955.
| Other Authors: | |
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| Language: | eng |
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MIT Lincoln Laboratory
2004
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| Online Access: | http://hdl.handle.net/1721.1/4786 |
| _version_ | 1826199375786803200 |
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| author2 | McWhorter, Alan L. (Alan Louis), 1930- |
| author_facet | McWhorter, Alan L. (Alan Louis), 1930- |
| collection | MIT |
| description | Issued also as a Sc.D. thesis in the Dept. of Electrical Engineering, 1955. |
| first_indexed | 2024-09-23T11:18:54Z |
| id | mit-1721.1/4786 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T11:18:54Z |
| publishDate | 2004 |
| publisher | MIT Lincoln Laboratory |
| record_format | dspace |
| spelling | mit-1721.1/47862019-04-12T08:17:40Z 1/f noise and related surface effects in germanium. McWhorter, Alan L. (Alan Louis), 1930- Lincoln Laboratory. TK7855.M41 L741 no.80 Semiconductors Noise Germanium Issued also as a Sc.D. thesis in the Dept. of Electrical Engineering, 1955. Bibliography: p. 110-112. 2004-03-03T21:21:25Z 2004-03-03T21:21:25Z 1955 no. 80 no. 295 http://hdl.handle.net/1721.1/4786 eng Technical report (Lincoln Laboratory) ; 80. Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 295. v, 122 p. 8692261 bytes application/pdf application/pdf MIT Lincoln Laboratory |
| spellingShingle | TK7855.M41 L741 no.80 Semiconductors Noise Germanium 1/f noise and related surface effects in germanium. |
| title | 1/f noise and related surface effects in germanium. |
| title_full | 1/f noise and related surface effects in germanium. |
| title_fullStr | 1/f noise and related surface effects in germanium. |
| title_full_unstemmed | 1/f noise and related surface effects in germanium. |
| title_short | 1/f noise and related surface effects in germanium. |
| title_sort | 1 f noise and related surface effects in germanium |
| topic | TK7855.M41 L741 no.80 Semiconductors Noise Germanium |
| url | http://hdl.handle.net/1721.1/4786 |