Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements
I propose a quantum imaging method that can beat the Rayleigh-Abbe diffraction limit and achieve de Broglie resolution without requiring a multi-photon absorber or coincidence detection. Using the same non-classical states of light as those for quantum lithography, the proposed method requires onl...
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| Format: | Article |
| Language: | en_US |
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American Physical Society
2009
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| Online Access: | http://hdl.handle.net/1721.1/49506 https://orcid.org/0000-0001-7173-1239 |
| _version_ | 1826198055784808448 |
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| author | Tsang, Mankei |
| author2 | Massachusetts Institute of Technology. Research Laboratory of Electronics |
| author_facet | Massachusetts Institute of Technology. Research Laboratory of Electronics Tsang, Mankei |
| author_sort | Tsang, Mankei |
| collection | MIT |
| description | I propose a quantum imaging method that can beat the Rayleigh-Abbe diffraction limit and achieve de Broglie
resolution without requiring a multi-photon absorber or coincidence detection. Using the same non-classical
states of light as those for quantum lithography, the proposed method requires only optical intensity measurements,
followed by image post-processing, to produce the same complex quantum interference patterns as those
in quantum lithography. The method is expected to be experimentally realizable using current technology. |
| first_indexed | 2024-09-23T10:58:09Z |
| format | Article |
| id | mit-1721.1/49506 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T10:58:09Z |
| publishDate | 2009 |
| publisher | American Physical Society |
| record_format | dspace |
| spelling | mit-1721.1/495062022-10-01T00:18:37Z Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements Tsang, Mankei Massachusetts Institute of Technology. Research Laboratory of Electronics Tsang, Mankei Tsang, Mankei I propose a quantum imaging method that can beat the Rayleigh-Abbe diffraction limit and achieve de Broglie resolution without requiring a multi-photon absorber or coincidence detection. Using the same non-classical states of light as those for quantum lithography, the proposed method requires only optical intensity measurements, followed by image post-processing, to produce the same complex quantum interference patterns as those in quantum lithography. The method is expected to be experimentally realizable using current technology. 2009-10-21T13:59:16Z 2009-10-21T13:59:16Z 2009-06 2009-03 Article http://purl.org/eprint/type/SubmittedJournalArticle 0031-9007 http://hdl.handle.net/1721.1/49506 Tsang, Mankei. “Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements.” Physical Review Letters 102.25 (2009): 253601-4. https://orcid.org/0000-0001-7173-1239 en_US http://dx.doi.org/10.1103/PhysRevLett.102.253601 Physical review letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society arXiv |
| spellingShingle | Tsang, Mankei Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements |
| title | Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements |
| title_full | Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements |
| title_fullStr | Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements |
| title_full_unstemmed | Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements |
| title_short | Quantum Imaging beyond the Diffraction Limit by Optical Centroid Measurements |
| title_sort | quantum imaging beyond the diffraction limit by optical centroid measurements |
| url | http://hdl.handle.net/1721.1/49506 https://orcid.org/0000-0001-7173-1239 |
| work_keys_str_mv | AT tsangmankei quantumimagingbeyondthediffractionlimitbyopticalcentroidmeasurements |