Solid State Physics
Contains reports on three research projects.
| Main Authors: | , , |
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| Format: | Technical Report |
| Language: | English |
| Published: |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
2010
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/51143 |
| _version_ | 1826199376370860032 |
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| author | Harvey, George G. Goldey, J. M. Thomas, J. B. |
| author_facet | Harvey, George G. Goldey, J. M. Thomas, J. B. |
| author_sort | Harvey, George G. |
| collection | MIT |
| description | Contains reports on three research projects. |
| first_indexed | 2024-09-23T11:18:55Z |
| format | Technical Report |
| id | mit-1721.1/51143 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T11:18:55Z |
| publishDate | 2010 |
| publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| record_format | dspace |
| spelling | mit-1721.1/511432019-04-12T23:49:30Z Solid State Physics Harvey, George G. Goldey, J. M. Thomas, J. B. Solid State Physics Soft X-ray Spectroscopy Microwave Study of Semiconductors Energy Levels of Impurities in Silicon Carbide Contains reports on three research projects. 2010-02-01T22:18:31Z 2010-02-01T22:18:31Z 1954-01-15 Technical Report RLE_QPR_032_III http://hdl.handle.net/1721.1/51143 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1954 Solid State Physics Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 32 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| spellingShingle | Solid State Physics Soft X-ray Spectroscopy Microwave Study of Semiconductors Energy Levels of Impurities in Silicon Carbide Harvey, George G. Goldey, J. M. Thomas, J. B. Solid State Physics |
| title | Solid State Physics |
| title_full | Solid State Physics |
| title_fullStr | Solid State Physics |
| title_full_unstemmed | Solid State Physics |
| title_short | Solid State Physics |
| title_sort | solid state physics |
| topic | Solid State Physics Soft X-ray Spectroscopy Microwave Study of Semiconductors Energy Levels of Impurities in Silicon Carbide |
| url | http://hdl.handle.net/1721.1/51143 |
| work_keys_str_mv | AT harveygeorgeg solidstatephysics AT goldeyjm solidstatephysics AT thomasjb solidstatephysics |