Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation

We uncover the constitutive relation of graphene and probe the physics of its optical phonons by studying its Raman spectrum as a function of uniaxial strain. We find that the doubly degenerate E[subscript 2g] optical mode splits in two components: one polarized along the strain and the other perpen...

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Main Authors: Mohiuddin, T. M. G., Lombardo, A., Nair, R. R., Bonetti, A., Savini, G., Jalil, R., Bonini, Nicola, Basko, D. M., Galiotis, C., Marzari, Nicola, Novoselov, Kostya S., Geim, A. K., Ferrari, A. C.
Drugi avtorji: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Jezik:en_US
Izdano: American Physical Society 2010
Online dostop:http://hdl.handle.net/1721.1/51376
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author Mohiuddin, T. M. G.
Lombardo, A.
Nair, R. R.
Bonetti, A.
Savini, G.
Jalil, R.
Bonini, Nicola
Basko, D. M.
Galiotis, C.
Marzari, Nicola
Novoselov, Kostya S.
Geim, A. K.
Ferrari, A. C.
author2 Massachusetts Institute of Technology. Department of Materials Science and Engineering
author_facet Massachusetts Institute of Technology. Department of Materials Science and Engineering
Mohiuddin, T. M. G.
Lombardo, A.
Nair, R. R.
Bonetti, A.
Savini, G.
Jalil, R.
Bonini, Nicola
Basko, D. M.
Galiotis, C.
Marzari, Nicola
Novoselov, Kostya S.
Geim, A. K.
Ferrari, A. C.
author_sort Mohiuddin, T. M. G.
collection MIT
description We uncover the constitutive relation of graphene and probe the physics of its optical phonons by studying its Raman spectrum as a function of uniaxial strain. We find that the doubly degenerate E[subscript 2g] optical mode splits in two components: one polarized along the strain and the other perpendicular. This splits the G peak into two bands, which we call G+ and G−, by analogy with the effect of curvature on the nanotube G peak. Both peaks redshift with increasing strain and their splitting increases, in excellent agreement with first-principles calculations. Their relative intensities are found to depend on light polarization, which provides a useful tool to probe the graphene crystallographic orientation with respect to the strain. The 2D and 2D′ bands also redshift but do not split for small strains. We study the Grüneisen parameters for the phonons responsible for the G, D, and D′ peaks. These can be used to measure the amount of uniaxial or biaxial strain, providing a fundamental tool for nanoelectronics, where strain monitoring is of paramount importance
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spelling mit-1721.1/513762022-10-02T08:19:06Z Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation Mohiuddin, T. M. G. Lombardo, A. Nair, R. R. Bonetti, A. Savini, G. Jalil, R. Bonini, Nicola Basko, D. M. Galiotis, C. Marzari, Nicola Novoselov, Kostya S. Geim, A. K. Ferrari, A. C. Massachusetts Institute of Technology. Department of Materials Science and Engineering Marzari, Nicola Bonini, Nicola Marzari, Nicola We uncover the constitutive relation of graphene and probe the physics of its optical phonons by studying its Raman spectrum as a function of uniaxial strain. We find that the doubly degenerate E[subscript 2g] optical mode splits in two components: one polarized along the strain and the other perpendicular. This splits the G peak into two bands, which we call G+ and G−, by analogy with the effect of curvature on the nanotube G peak. Both peaks redshift with increasing strain and their splitting increases, in excellent agreement with first-principles calculations. Their relative intensities are found to depend on light polarization, which provides a useful tool to probe the graphene crystallographic orientation with respect to the strain. The 2D and 2D′ bands also redshift but do not split for small strains. We study the Grüneisen parameters for the phonons responsible for the G, D, and D′ peaks. These can be used to measure the amount of uniaxial or biaxial strain, providing a fundamental tool for nanoelectronics, where strain monitoring is of paramount importance University of Palermo Sultan Qaboos University MITRE Interconnect Focus Center European Research Council Royal Society 2010-02-05T16:17:53Z 2010-02-05T16:17:53Z 2009-05 2009-03 Article http://purl.org/eprint/type/JournalArticle 1550-235X 1098-0121 http://hdl.handle.net/1721.1/51376 Mohiuddin, T. M. G. et al. “Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation.” Physical Review B 79.20 (2009): 205433. (C) 2010 The American Physical Society. en_US http://dx.doi.org/10.1103/PhysRevB.79.205433 Physical Review B Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society APS
spellingShingle Mohiuddin, T. M. G.
Lombardo, A.
Nair, R. R.
Bonetti, A.
Savini, G.
Jalil, R.
Bonini, Nicola
Basko, D. M.
Galiotis, C.
Marzari, Nicola
Novoselov, Kostya S.
Geim, A. K.
Ferrari, A. C.
Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation
title Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation
title_full Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation
title_fullStr Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation
title_full_unstemmed Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation
title_short Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation
title_sort uniaxial strain in graphene by raman spectroscopy g peak splitting gruneisen parameters and sample orientation
url http://hdl.handle.net/1721.1/51376
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