Noninvasive electron microscopy with interaction-free quantum measurements
We propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates a...
Main Authors: | Putnam, William P., Yanik, Mehmet Fatih |
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Other Authors: | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
Format: | Article |
Language: | en_US |
Published: |
American Physical Society
2010
|
Online Access: | http://hdl.handle.net/1721.1/52312 |
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