Polarimetry with a soft x-ray spectrometer
An approach for measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics is described. A set of multilayer-coated flats reflect the dispersed X-rays to the instrument detectors. The intensity variation as a function of energy and position angle is measured to det...
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| Format: | Article |
| Language: | en_US |
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Society of Photo-optical Instrumentation Engineers
2010
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| Online Access: | http://hdl.handle.net/1721.1/52654 |