Reliable InP-based Geiger-mode Avalanche Photodiode Arrays
Arrays as large as 256 x 64 of single-photon counting avalanche photodiodes have been developed for defense applications in free-space communication and laser radar. Focal plane arrays (FPAs) sensitive to both 1.06 and 1.55 µm wavelength have been fabricated for these applications. At 240 K and 4 V...
| Main Authors: | , , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Society of Photo-optical Instrumentation Engineers
2010
|
| Online Access: | http://hdl.handle.net/1721.1/52685 |
| _version_ | 1826206735745941504 |
|---|---|
| author | Smith, Gary M. McIntosh, K. Alexander Donnelly, Joseph P. Funk, Joseph E. Mahoney, Leonard J. Verghese, Simon |
| author2 | Lincoln Laboratory |
| author_facet | Lincoln Laboratory Smith, Gary M. McIntosh, K. Alexander Donnelly, Joseph P. Funk, Joseph E. Mahoney, Leonard J. Verghese, Simon |
| author_sort | Smith, Gary M. |
| collection | MIT |
| description | Arrays as large as 256 x 64 of single-photon counting avalanche photodiodes have been developed for defense applications in free-space communication and laser radar. Focal plane arrays (FPAs) sensitive to both 1.06 and 1.55 µm wavelength have been fabricated for these applications. At 240 K and 4 V overbias, the dark count rate (DCR) of 15 µm diameter devices is typically 250 Hz for 1.06 µm sensitive APDs and 1 kHz for 1.55 µm APDs. Photon detection efficiencies (PDE) at 4 V overbias are about 45% for both types of APDs. Accounting for microlens losses, the full FPA has a PDE of 30%. The reset time needed for a pixel to avoid afterpulsing at 240 K is about 3-4 µsec. These devices have been used by system groups at Lincoln Laboratory and other defense contractors for building operational systems. For these fielded systems the device reliability is a strong concern. Individual APDs as well as full arrays have been run for over 1000 hrs of accelerated testing to verify their stability. The reliability of these GM-APDs is shown to be under 10 FITs at operating temperatures of 250 K, which also corresponds to an MTTF of 17,100 yrs. |
| first_indexed | 2024-09-23T13:37:45Z |
| format | Article |
| id | mit-1721.1/52685 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T13:37:45Z |
| publishDate | 2010 |
| publisher | Society of Photo-optical Instrumentation Engineers |
| record_format | dspace |
| spelling | mit-1721.1/526852022-09-28T15:08:17Z Reliable InP-based Geiger-mode Avalanche Photodiode Arrays Smith, Gary M. McIntosh, K. Alexander Donnelly, Joseph P. Funk, Joseph E. Mahoney, Leonard J. Verghese, Simon Lincoln Laboratory Smith, Gary M. Smith, Gary M. McIntosh, K. Alexander Donnelly, Joseph P. Funk, Joseph E. Mahoney, Leonard J. Verghese, Simon Arrays as large as 256 x 64 of single-photon counting avalanche photodiodes have been developed for defense applications in free-space communication and laser radar. Focal plane arrays (FPAs) sensitive to both 1.06 and 1.55 µm wavelength have been fabricated for these applications. At 240 K and 4 V overbias, the dark count rate (DCR) of 15 µm diameter devices is typically 250 Hz for 1.06 µm sensitive APDs and 1 kHz for 1.55 µm APDs. Photon detection efficiencies (PDE) at 4 V overbias are about 45% for both types of APDs. Accounting for microlens losses, the full FPA has a PDE of 30%. The reset time needed for a pixel to avoid afterpulsing at 240 K is about 3-4 µsec. These devices have been used by system groups at Lincoln Laboratory and other defense contractors for building operational systems. For these fielded systems the device reliability is a strong concern. Individual APDs as well as full arrays have been run for over 1000 hrs of accelerated testing to verify their stability. The reliability of these GM-APDs is shown to be under 10 FITs at operating temperatures of 250 K, which also corresponds to an MTTF of 17,100 yrs. U.S. Defense Advanced Research Project Agency (Air Force contract number FA8721-05-C-0002) 2010-03-17T19:27:50Z 2010-03-17T19:27:50Z 2009-04 2009-04 Article http://purl.org/eprint/type/JournalArticle 0277-786X SPIE CID: 73200R-10 http://hdl.handle.net/1721.1/52685 Smith, Gary M. et al. “Reliable InP-based Geiger-mode avalanche photodiode arrays.” Advanced Photon Counting Techniques III. Ed. Mark A. Itzler & Joe C. Campbell. Orlando, FL, USA: SPIE, 2009. 73200R-10. © 2009 SPIE en_US http://dx.doi.org/10.1117/12.819126 Proceedings of SPIE--the International Society for Optical Engineering Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Society of Photo-optical Instrumentation Engineers SPIE |
| spellingShingle | Smith, Gary M. McIntosh, K. Alexander Donnelly, Joseph P. Funk, Joseph E. Mahoney, Leonard J. Verghese, Simon Reliable InP-based Geiger-mode Avalanche Photodiode Arrays |
| title | Reliable InP-based Geiger-mode Avalanche Photodiode Arrays |
| title_full | Reliable InP-based Geiger-mode Avalanche Photodiode Arrays |
| title_fullStr | Reliable InP-based Geiger-mode Avalanche Photodiode Arrays |
| title_full_unstemmed | Reliable InP-based Geiger-mode Avalanche Photodiode Arrays |
| title_short | Reliable InP-based Geiger-mode Avalanche Photodiode Arrays |
| title_sort | reliable inp based geiger mode avalanche photodiode arrays |
| url | http://hdl.handle.net/1721.1/52685 |
| work_keys_str_mv | AT smithgarym reliableinpbasedgeigermodeavalanchephotodiodearrays AT mcintoshkalexander reliableinpbasedgeigermodeavalanchephotodiodearrays AT donnellyjosephp reliableinpbasedgeigermodeavalanchephotodiodearrays AT funkjosephe reliableinpbasedgeigermodeavalanchephotodiodearrays AT mahoneyleonardj reliableinpbasedgeigermodeavalanchephotodiodearrays AT verghesesimon reliableinpbasedgeigermodeavalanchephotodiodearrays |