Far-IR reflectance spectra analysis of CdZnTe and related materials
Far-infrared (FIR) reflectance spectroscopy has been employed to study the optical properties for a series of bulk CdZnxTe1-x and CdSexTe1-x wafers. The zone-centre optical phonons for the ternary alloys show a variety of behavior patterns: they exhibit a "one-mode", "two-mode" o...
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| Format: | Article |
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The International Society for Optical Engineering
2010
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| Online Access: | http://hdl.handle.net/1721.1/52741 https://orcid.org/0000-0002-0769-0652 |
| _version_ | 1826210225307254784 |
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| author | Becla, Piotr Feng, Zhe Chuan Tien, Der-Chi Yang, Yu-Chang Hou, Fu-Chung Shih, Yen-Hao Jhang, Sheng-Hong Yang, Tzuen-Rong |
| author2 | MIT Materials Research Laboratory |
| author_facet | MIT Materials Research Laboratory Becla, Piotr Feng, Zhe Chuan Tien, Der-Chi Yang, Yu-Chang Hou, Fu-Chung Shih, Yen-Hao Jhang, Sheng-Hong Yang, Tzuen-Rong |
| author_sort | Becla, Piotr |
| collection | MIT |
| description | Far-infrared (FIR) reflectance spectroscopy has been employed to study the optical properties for a series of bulk CdZnxTe1-x and CdSexTe1-x wafers. The zone-centre optical phonons for the ternary alloys show a variety of behavior patterns: they exhibit a "one-mode", "two-mode" or "intermediate-mode" behavior depending on the vibration characteristics of the end binary members. The CdSeTe called CST were found to be single-crystal with the zincblende structure. These four samples labeled with CST5, CST15, CST25, and CST35, which correspond with the composition of Se, 5%, 15%, 25%, 35%, respectively. The intensity of CdTe-like TO band decays with x increasing, and the peak position increases from 140 cm[superscript -1] to 145 cm[superscript -1]. In the other hand, the intensity of CdSe-like TO band grows with x increasing, and the peak position of CdSe-like TO band increases from 174 cm[superscript -1] to 181 cm[superscript -1]. We use the model of dielectric function and using Least-Square fit to find the optical and transport parameters. By the infrared spectra analysis, we found the conductivity of CdZn[subscript x]Te[subscript 1-x] increase with increasing of x value and the conductivity of CdZn[subscript x]Te[subscript 1-x] decrease with increasing of x value. |
| first_indexed | 2024-09-23T14:46:26Z |
| format | Article |
| id | mit-1721.1/52741 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T14:46:26Z |
| publishDate | 2010 |
| publisher | The International Society for Optical Engineering |
| record_format | dspace |
| spelling | mit-1721.1/527412022-09-29T10:25:50Z Far-IR reflectance spectra analysis of CdZnTe and related materials Becla, Piotr Feng, Zhe Chuan Tien, Der-Chi Yang, Yu-Chang Hou, Fu-Chung Shih, Yen-Hao Jhang, Sheng-Hong Yang, Tzuen-Rong MIT Materials Research Laboratory Francis Bitter Magnet Laboratory (Massachusetts Institute of Technology) Becla, Piotr Becla, Piotr Far-infrared (FIR) reflectance spectroscopy has been employed to study the optical properties for a series of bulk CdZnxTe1-x and CdSexTe1-x wafers. The zone-centre optical phonons for the ternary alloys show a variety of behavior patterns: they exhibit a "one-mode", "two-mode" or "intermediate-mode" behavior depending on the vibration characteristics of the end binary members. The CdSeTe called CST were found to be single-crystal with the zincblende structure. These four samples labeled with CST5, CST15, CST25, and CST35, which correspond with the composition of Se, 5%, 15%, 25%, 35%, respectively. The intensity of CdTe-like TO band decays with x increasing, and the peak position increases from 140 cm[superscript -1] to 145 cm[superscript -1]. In the other hand, the intensity of CdSe-like TO band grows with x increasing, and the peak position of CdSe-like TO band increases from 174 cm[superscript -1] to 181 cm[superscript -1]. We use the model of dielectric function and using Least-Square fit to find the optical and transport parameters. By the infrared spectra analysis, we found the conductivity of CdZn[subscript x]Te[subscript 1-x] increase with increasing of x value and the conductivity of CdZn[subscript x]Te[subscript 1-x] decrease with increasing of x value. 2010-03-19T16:22:44Z 2010-03-19T16:22:44Z 2009-09 Article http://purl.org/eprint/type/JournalArticle 0277-786X http://hdl.handle.net/1721.1/52741 Yang, Tzuen-Rong et al. “Far-IR reflectance spectra analysis of CdZnTe and related materials.” Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI. Ed. Ralph B. James, Larry A. Franks, & Arnold Burger. San Diego, CA, USA: SPIE, 2009. 74490L-9. © 2009 SPIE--The International Society for Optical Engineering https://orcid.org/0000-0002-0769-0652 en_US http://dx.doi.org/10.1117/12.825874 Proceedings of SPIE Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf The International Society for Optical Engineering SPIE |
| spellingShingle | Becla, Piotr Feng, Zhe Chuan Tien, Der-Chi Yang, Yu-Chang Hou, Fu-Chung Shih, Yen-Hao Jhang, Sheng-Hong Yang, Tzuen-Rong Far-IR reflectance spectra analysis of CdZnTe and related materials |
| title | Far-IR reflectance spectra analysis of CdZnTe and related materials |
| title_full | Far-IR reflectance spectra analysis of CdZnTe and related materials |
| title_fullStr | Far-IR reflectance spectra analysis of CdZnTe and related materials |
| title_full_unstemmed | Far-IR reflectance spectra analysis of CdZnTe and related materials |
| title_short | Far-IR reflectance spectra analysis of CdZnTe and related materials |
| title_sort | far ir reflectance spectra analysis of cdznte and related materials |
| url | http://hdl.handle.net/1721.1/52741 https://orcid.org/0000-0002-0769-0652 |
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