Channel engineering of SOI MOSFETs for RF applications
Channel engineering of SOI MOSFETs is explored by altering ion implantation without adding any new fabrication steps to the standard CMOS process. The effects of implantation on characteristics important for RF applications, such as transconductance, output resistance, breakdown voltage, are compare...
Main Authors: | Keast, Craig L., Wyatt, Peter W., Healey, Paul D., Yost, Donna-Ruth W., Gouker, Pascale M., Chen, Chenson K., Kedzierski, Jakub T., Knecht, Jeffrey M., Chen, Chang-Lee |
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Other Authors: | Lincoln Laboratory |
Format: | Article |
Language: | en_US |
Published: |
Institute of Electrical and Electronics Engineers
2010
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Online Access: | http://hdl.handle.net/1721.1/53745 |
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