_version_ 1811073184551665664
author Geick, R.
Perry, C. H.
author_facet Geick, R.
Perry, C. H.
author_sort Geick, R.
collection MIT
description Contains report on one research project.
first_indexed 2024-09-23T09:29:42Z
format Technical Report
id mit-1721.1/55596
institution Massachusetts Institute of Technology
language English
last_indexed 2024-09-23T09:29:42Z
publishDate 2010
publisher Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
record_format dspace
spelling mit-1721.1/555962019-04-10T08:42:47Z Optical and Infrared Spectroscopy Geick, R. Perry, C. H. Optical Spectroscopy Infrared Spectroscopy Analysis of Reflection Spectra by Means of a Fit with a Classical Dispersion Formula Contains report on one research project. 2010-06-07T18:40:13Z 2010-06-07T18:40:13Z 1965-04-15 Technical Report RLE_QPR_077_IV http://hdl.handle.net/1721.1/55596 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1965 General Physics Optical and Infrared Spectroscopy Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 77 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
spellingShingle Optical Spectroscopy
Infrared Spectroscopy
Analysis of Reflection Spectra by Means of a Fit with a Classical Dispersion Formula
Geick, R.
Perry, C. H.
Optical and Infrared Spectroscopy
title Optical and Infrared Spectroscopy
title_full Optical and Infrared Spectroscopy
title_fullStr Optical and Infrared Spectroscopy
title_full_unstemmed Optical and Infrared Spectroscopy
title_short Optical and Infrared Spectroscopy
title_sort optical and infrared spectroscopy
topic Optical Spectroscopy
Infrared Spectroscopy
Analysis of Reflection Spectra by Means of a Fit with a Classical Dispersion Formula
url http://hdl.handle.net/1721.1/55596
work_keys_str_mv AT geickr opticalandinfraredspectroscopy
AT perrych opticalandinfraredspectroscopy