Noise in Electron Devices
Contains research objectives.
| Main Author: | |
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| Format: | Technical Report |
| Language: | English |
| Published: |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
2010
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/55691 |
| _version_ | 1826217738245242880 |
|---|---|
| author | Rafuse, R. P. |
| author_facet | Rafuse, R. P. |
| author_sort | Rafuse, R. P. |
| collection | MIT |
| description | Contains research objectives. |
| first_indexed | 2024-09-23T17:08:22Z |
| format | Technical Report |
| id | mit-1721.1/55691 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T17:08:22Z |
| publishDate | 2010 |
| publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| record_format | dspace |
| spelling | mit-1721.1/556912019-04-10T09:09:04Z Noise in Electron Devices Rafuse, R. P. Noise in Electron Devices Contains research objectives. National Aeronautics and Space Administration (Grant NRG-22-009-163) 2010-06-07T21:32:43Z 2010-06-07T21:32:43Z 1968-01-15 Technical Report RLE_QPR_088_XIV http://hdl.handle.net/1721.1/55691 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1968 General Physics Noise in Electron Devices Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 88 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| spellingShingle | Noise in Electron Devices Rafuse, R. P. Noise in Electron Devices |
| title | Noise in Electron Devices |
| title_full | Noise in Electron Devices |
| title_fullStr | Noise in Electron Devices |
| title_full_unstemmed | Noise in Electron Devices |
| title_short | Noise in Electron Devices |
| title_sort | noise in electron devices |
| topic | Noise in Electron Devices |
| url | http://hdl.handle.net/1721.1/55691 |
| work_keys_str_mv | AT rafuserp noiseinelectrondevices |