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Bibliographic Details
Main Authors: Kennedy, Robert S., Hoversten, E. V., Gallager, R. G., Elias, Peter, Yuen, Horace P. H.
Format: Technical Report
Language:English
Published: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Subjects:
Online Access:http://hdl.handle.net/1721.1/56046
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