Electron Optics
Contains research objectives, summary of research on one research project, and reports on two research project.
| Main Authors: | , , , |
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| Format: | Technical Report |
| Language: | English |
| Published: |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
2010
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/56531 |
| _version_ | 1826192255240634368 |
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| author | King, John G. Coleman, John W. Wittels, Norman D. Jacobsen, Edward H. |
| author_facet | King, John G. Coleman, John W. Wittels, Norman D. Jacobsen, Edward H. |
| author_sort | King, John G. |
| collection | MIT |
| description | Contains research objectives, summary of research on one research project, and reports on two research project. |
| first_indexed | 2024-09-23T09:08:23Z |
| format | Technical Report |
| id | mit-1721.1/56531 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T09:08:23Z |
| publishDate | 2010 |
| publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| record_format | dspace |
| spelling | mit-1721.1/565312019-04-10T20:59:30Z Electron Optics King, John G. Coleman, John W. Wittels, Norman D. Jacobsen, Edward H. Electron Optics High-Resolution High-Contrast Electron Optics Electron Lens Field Calculations Condenser Underfocus vs Overfocus in the Transmission Electron Microscope (TEM) Contains research objectives, summary of research on one research project, and reports on two research project. Joint Services Electronics Program (Contract DAAB07-74-C-0630) 2010-07-15T03:08:20Z 2010-07-15T03:08:20Z 1975-01 Technical Report RLE_PR_115_II http://hdl.handle.net/1721.1/56531 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1975 General Physics Electron Optics Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 115 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf image/tiff image/tiff image/tiff image/tiff image/tiff image/tiff image/tiff image/tiff image/tiff image/tiff image/tiff image/tiff Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| spellingShingle | Electron Optics High-Resolution High-Contrast Electron Optics Electron Lens Field Calculations Condenser Underfocus vs Overfocus in the Transmission Electron Microscope (TEM) King, John G. Coleman, John W. Wittels, Norman D. Jacobsen, Edward H. Electron Optics |
| title | Electron Optics |
| title_full | Electron Optics |
| title_fullStr | Electron Optics |
| title_full_unstemmed | Electron Optics |
| title_short | Electron Optics |
| title_sort | electron optics |
| topic | Electron Optics High-Resolution High-Contrast Electron Optics Electron Lens Field Calculations Condenser Underfocus vs Overfocus in the Transmission Electron Microscope (TEM) |
| url | http://hdl.handle.net/1721.1/56531 |
| work_keys_str_mv | AT kingjohng electronoptics AT colemanjohnw electronoptics AT wittelsnormand electronoptics AT jacobsenedwardh electronoptics |