Optical Spectroscopy of Disordered Materials and X-Ray Scattering from Surfaces
Contains reports on two research projects.
Main Authors: | Litster, James David, Larson, Brent D., Solomon, Lorraine E. |
---|---|
Format: | Technical Report |
Language: | English |
Published: |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
2010
|
Subjects: | |
Online Access: | http://hdl.handle.net/1721.1/56881 |
Similar Items
-
Optical Spectroscopy of Disordered Materials and X-Ray Scattering from Surfaces
by: Larson, Brent D., et al.
Published: (2010) -
Optical Spectroscopy of Disordered Materials
by: Larson, Brent D., et al.
Published: (2010) -
X-Ray Scattering Spectroscopy
by: Birgeneau, Robert J.
Published: (2010) -
Synchrotron X-Ray Studies of Surface Disordering
by: Birgeneau, Robert J., et al.
Published: (2010) -
Synchrotron X-Ray Studies of Surface Disordering
by: Birgeneau, Robert J., et al.
Published: (2010)