Ultralow Temperature Studies of Electronic Conduction in Submicron Silicon Inversion Layers

Ultralow Temperature Studies of Electronic Conduction in Submicron Silicon Inversion Layers

Contains research summary.

Bibliographic Details
Main Author:	Kastner, Marc A.
Format:	Technical Report
Language:	English
Published:	Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Subjects:	Ultralow Temperature Studies of Electronic Conduction in Submicron Silicon Inversion Layers
Online Access:	http://hdl.handle.net/1721.1/56957

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