Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices
Contains project goals.
| Main Authors: | , , , , |
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| Format: | Technical Report |
| Language: | English |
| Published: |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
2010
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/57016 |
| Summary: | Contains project goals. |
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