Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices

Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices

Contains project goals.

Bibliografiske detaljer
Main Authors: Kastner, Marc A., Field, Stuart B., Scott-Thomas, John H. F., Meirav, Udi, Park, Samuel L.
Format: Technical Report
Sprog:English
Udgivet: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Fag:
Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices
Online adgang:http://hdl.handle.net/1721.1/57016
Beskrivelse
Summary:Contains project goals.

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