Ultralow Temperature Studies of Nanometer Size Semiconductor Devices

Ultralow Temperature Studies of Nanometer Size Semiconductor Devices

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Contains report on one research project.

Bibliographic Details
Main Authors: Kastner, Marc A., Field, Stuart B., Meirav, Udi, Park, Samuel L., Scott-Thomas, John H. F.
Format: Technical Report
Language:English
Published: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Subjects:
Ultralow Temperature Studies of Nanometer Size Semiconductor Devices
Online Access:http://hdl.handle.net/1721.1/57057

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