Synchrotron X-Ray Studies of Surface Disordering

Contains an introduction, reports on three research projects and a list of publications.

Bibliographic Details
Main Authors:	Birgeneau, Robert J., Blum, Kenneth I., Mak, Alan, Noh, Do-Young, Nuttall, William J., Ramstad, Monte J., Salvucci, Elizabeth M.
Format:	Technical Report
Language:	English
Published:	Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Subjects:	Synchrotron X-Ray Studies of Surface Disordering Metal Surface Studies Semiconductor Surface Studies Stepped Si(111) Surfaces Publications
Online Access:	http://hdl.handle.net/1721.1/57130

Description
Summary:	Contains an introduction, reports on three research projects and a list of publications.

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