Custom Integrated Circuits

Custom Integrated Circuits

Pokaż inne wersje (19)

Contains table of contents for Part III, table of contents for Section 1 and reports on nine research projects.

Opis bibliograficzny
Główni autorzy:	Allen, Jonathan, Wyatt, John L., Jr., White, Jacob K., Devadas, Srinivas, Armstrong, Robert C., Baltus, Donald G., Pickelsimer, Lisa A., Reichelt, Mark W., Van Aelten, Filip J., Horn, Berthold K. P., Lee, Hae-Seung, Sodini, Charles G., Poggio, Tomaso, Decker, Steven J., Dron, Lisa G., Elfadel, Ibrahim M., Eshghi, Kamyar, Hakkarainen, Mikko, Harris, John G., Herrmann, Frederick P., Keast, Craig L., Martin, David R., McQuirk, Ignacio S., Seidel, Mark N., Standley, David L., Thompson, Clay M., Umminger, Christopher B., Yu, Paul C., Lumsdaine, Andrew, Silveira, Luis M., Leeb, Steve B., Lloyd, Jennifer A., Rahmat, Khalid, Antoniadis, Dimitri A., Nabors, Keith S., Kim, Songmin, Ali, Sami M., Telichevsky, Ricardo, Dally, William J., Kamon, Mattan, Schmidt, Martin A., Senturia, Stephen D., Kukula, James H., Bai, Kelly S., Liao, Stan Y., Shen, Amelia H.
Format:	Technical Report
Język:	English
Wydane:	Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Hasła przedmiotowe:	Custom Integrated Circuits Analog VLSI Systems for Integrated Image Acquisition Analog VLSI Systems for Early Vision Processing Mixed Circuit/Device Simulation Simulation Algorithms for Clocked Analog Circuits Numerical Simulation of Short Channel MOS Devices Efficient Three-Dimensional Interconnect Analysis Parallel Numerical Algorithms Microelectromechanical Computer-Aided Design Techniques for Logic Synthesis Techniques for Formal Verification Techniques for Testing
Dostęp online:	http://hdl.handle.net/1721.1/57168

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