Synchrotron X-Ray Studies of Surface Disordering
Contains an introduction and reports on three research projects.
| Main Authors: | , , , , , |
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| Format: | Technical Report |
| Language: | English |
| Published: |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
2010
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/57231 |
| _version_ | 1826210606260158464 |
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| author | Birgeneau, Robert J. Blum, Kenneth I. Noh, Do-Young Nuttall, William J. Ramstad, Monte J. McCaffery, Elizabeth M. |
| author_facet | Birgeneau, Robert J. Blum, Kenneth I. Noh, Do-Young Nuttall, William J. Ramstad, Monte J. McCaffery, Elizabeth M. |
| author_sort | Birgeneau, Robert J. |
| collection | MIT |
| description | Contains an introduction and reports on three research projects. |
| first_indexed | 2024-09-23T14:52:37Z |
| format | Technical Report |
| id | mit-1721.1/57231 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T14:52:37Z |
| publishDate | 2010 |
| publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| record_format | dspace |
| spelling | mit-1721.1/572312019-04-12T23:58:31Z Synchrotron X-Ray Studies of Surface Disordering Birgeneau, Robert J. Blum, Kenneth I. Noh, Do-Young Nuttall, William J. Ramstad, Monte J. McCaffery, Elizabeth M. Synchrotron X-Ray Studies of Surface Disordering Metal Surfaces Studies Semiconductor Surface Studies Model Surface Overlayers Contains an introduction and reports on three research projects. Joint Services Electronics Program Contract DAAL03-92-C-0001 2010-07-16T05:18:38Z 2010-07-16T05:18:38Z 1992-01-01 to 1992-12-31 Technical Report RLE_PR_135_01_04s_02 http://hdl.handle.net/1721.1/57231 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1992 Solid State Physics, Electronics and Optics Surfaces and Interfaces Synchrotron X-Ray Studies of Surface Disordering Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 135 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| spellingShingle | Synchrotron X-Ray Studies of Surface Disordering Metal Surfaces Studies Semiconductor Surface Studies Model Surface Overlayers Birgeneau, Robert J. Blum, Kenneth I. Noh, Do-Young Nuttall, William J. Ramstad, Monte J. McCaffery, Elizabeth M. Synchrotron X-Ray Studies of Surface Disordering |
| title | Synchrotron X-Ray Studies of Surface Disordering |
| title_full | Synchrotron X-Ray Studies of Surface Disordering |
| title_fullStr | Synchrotron X-Ray Studies of Surface Disordering |
| title_full_unstemmed | Synchrotron X-Ray Studies of Surface Disordering |
| title_short | Synchrotron X-Ray Studies of Surface Disordering |
| title_sort | synchrotron x ray studies of surface disordering |
| topic | Synchrotron X-Ray Studies of Surface Disordering Metal Surfaces Studies Semiconductor Surface Studies Model Surface Overlayers |
| url | http://hdl.handle.net/1721.1/57231 |
| work_keys_str_mv | AT birgeneaurobertj synchrotronxraystudiesofsurfacedisordering AT blumkennethi synchrotronxraystudiesofsurfacedisordering AT nohdoyoung synchrotronxraystudiesofsurfacedisordering AT nuttallwilliamj synchrotronxraystudiesofsurfacedisordering AT ramstadmontej synchrotronxraystudiesofsurfacedisordering AT mccafferyelizabethm synchrotronxraystudiesofsurfacedisordering |