Semiconductor Surface Studies

Semiconductor Surface Studies

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Contains an introduction, reports on two research projects and a list of publications.

Bibliographic Details
Main Authors: Joannopoulos, John D., Arias, Tomas A., Meade, Robert D., Capaz, Rodrigo B., Cho, Kyeongjae, Wang, Jing, Ariel, Imadiel
Format: Technical Report
Language:English
Published: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Subjects:
Semiconductor Surface Studies
Defects on Surfaces
Cross-sectional Scanning Tunneling Microscopy
Online Access:http://hdl.handle.net/1721.1/57259
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Semiconductor Surface Studies

Semiconductor Surface Studies by Joannopoulos, John D.

Published 2010
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Technical Report
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Semiconductor Surface Studies

Semiconductor Surface Studies by Joannopoulos, John D.

Published 2010
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Technical Report
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Semiconductor Surface Studies

Semiconductor Surface Studies by Joannopoulos, John D.

Published 2010
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Technical Report
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Semiconductor Surface Studies

Semiconductor Surface Studies by Joannopoulos, John D.

Published 2010
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Technical Report
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Semiconductor Surface Studies

Semiconductor Surface Studies by Joannopoulos, John D.

Published 2010
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Technical Report
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Semiconductor Surface Studies

Semiconductor Surface Studies by Joannopoulos, John D.

Published 2010
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Technical Report
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