Synchrotron X-Ray Studies of Surface Disordering

Contains an introduction, reports on three research projects and a list of publications.

Bibliographic Details
Main Authors:	Birgeneau, Robert J., Wells, Barry, Ramstad, Monte J., Young, Michael J., Harring, Debra L.
Format:	Technical Report
Language:	English
Published:	Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Subjects:	Synchrotron X-Ray Studies of Surface Disordering Vicinal Semiconductor Surfaces Chiral Melting of the Si(113) (3x1) Reconstruction Two-Dimensional Melting
Online Access:	http://hdl.handle.net/1721.1/57273

Description
Summary:	Contains an introduction, reports on three research projects and a list of publications.

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