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author Berker, A. Nihat
Falicov, Alexis
Kabakçioḡlu, Alkan
Aalberts, Daniel P.
Hoston, William C., Jr.
Naqvi, Asad A.
Joannopoulos, John D.
author_facet Berker, A. Nihat
Falicov, Alexis
Kabakçioḡlu, Alkan
Aalberts, Daniel P.
Hoston, William C., Jr.
Naqvi, Asad A.
Joannopoulos, John D.
author_sort Berker, A. Nihat
collection MIT
description Contains table of contents for Section 4, an introduction, reports on four research projects and a list of publications.
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format Technical Report
id mit-1721.1/57280
institution Massachusetts Institute of Technology
language English
last_indexed 2024-09-23T13:11:51Z
publishDate 2010
publisher Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
record_format dspace
spelling mit-1721.1/572802019-04-10T13:54:45Z Statistical Mechanics of Constrained Electronic Systems and Semiconductor Structures Berker, A. Nihat Falicov, Alexis Kabakçioḡlu, Alkan Aalberts, Daniel P. Hoston, William C., Jr. Naqvi, Asad A. Joannopoulos, John D. Statistical Mechanics of Constrained Electronic Systems Statistical Mechanics of Semiconductor Structures Renormalization-Group Approach to Highly Correlated Electronic Systems Statistical Mechanics of Mesoscopic Systems Statistical Mechanics of Quantum Dots Collective Phenomena in Systems with Quenched Impurities Collective Phenomena in Systems with Quenched Frustration Surface of Semiconductor Alloys Bulk Structures of Semiconductor Alloys Contains table of contents for Section 4, an introduction, reports on four research projects and a list of publications. Joint Services Electronics Program Contract DAAL03-92-C-0001 2010-07-16T19:29:00Z 2010-07-16T19:29:00Z 1993-01-01 to 1993-12-31 Technical Report RLE_PR_136_01_04s_01 http://hdl.handle.net/1721.1/57280 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1993 Solid State Physics, Electronics and Optics Surfaces and Interfaces Statistical Mechanics of Constrained Electronic Systems and Semiconductor Structures Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 136 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
spellingShingle Statistical Mechanics of Constrained Electronic Systems
Statistical Mechanics of Semiconductor Structures
Renormalization-Group Approach to Highly Correlated Electronic Systems
Statistical Mechanics of Mesoscopic Systems
Statistical Mechanics of Quantum Dots
Collective Phenomena in Systems with Quenched Impurities
Collective Phenomena in Systems with Quenched Frustration
Surface of Semiconductor Alloys
Bulk Structures of Semiconductor Alloys
Berker, A. Nihat
Falicov, Alexis
Kabakçioḡlu, Alkan
Aalberts, Daniel P.
Hoston, William C., Jr.
Naqvi, Asad A.
Joannopoulos, John D.
Statistical Mechanics of Constrained Electronic Systems and Semiconductor Structures
title Statistical Mechanics of Constrained Electronic Systems and Semiconductor Structures
title_full Statistical Mechanics of Constrained Electronic Systems and Semiconductor Structures
title_fullStr Statistical Mechanics of Constrained Electronic Systems and Semiconductor Structures
title_full_unstemmed Statistical Mechanics of Constrained Electronic Systems and Semiconductor Structures
title_short Statistical Mechanics of Constrained Electronic Systems and Semiconductor Structures
title_sort statistical mechanics of constrained electronic systems and semiconductor structures
topic Statistical Mechanics of Constrained Electronic Systems
Statistical Mechanics of Semiconductor Structures
Renormalization-Group Approach to Highly Correlated Electronic Systems
Statistical Mechanics of Mesoscopic Systems
Statistical Mechanics of Quantum Dots
Collective Phenomena in Systems with Quenched Impurities
Collective Phenomena in Systems with Quenched Frustration
Surface of Semiconductor Alloys
Bulk Structures of Semiconductor Alloys
url http://hdl.handle.net/1721.1/57280
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