Single-Electron Spectroscopy
Contains research goals and objectives, reports on four research projects and a list of publications.
| Main Authors: | , , , , , |
|---|---|
| Format: | Technical Report |
| Language: | English |
| Published: |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
2010
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/57302 |
| _version_ | 1811087686042124288 |
|---|---|
| author | Ashoori, Raymond C. Chan, Ho-Bun Berman, David B. Brodsky, Mikhail G. Heemeyer, Sven Folch, Albert |
| author_facet | Ashoori, Raymond C. Chan, Ho-Bun Berman, David B. Brodsky, Mikhail G. Heemeyer, Sven Folch, Albert |
| author_sort | Ashoori, Raymond C. |
| collection | MIT |
| description | Contains research goals and objectives, reports on four research projects and a list of publications. |
| first_indexed | 2024-09-23T13:50:23Z |
| format | Technical Report |
| id | mit-1721.1/57302 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T13:50:23Z |
| publishDate | 2010 |
| publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| record_format | dspace |
| spelling | mit-1721.1/573022019-04-10T13:33:06Z Single-Electron Spectroscopy Ashoori, Raymond C. Chan, Ho-Bun Berman, David B. Brodsky, Mikhail G. Heemeyer, Sven Folch, Albert Single-Electron Spectroscopy Traps Created by Disorder in Semiconductor Structures Traps Created by Impurities in Semiconductor Structures Artificial Atoms Spatially Resolved Charge Sensing Single-Electron Transistors for Spectroscopy Contains research goals and objectives, reports on four research projects and a list of publications. Joint Services Electronics Program Contract DAAL03-92-C-0001 Joint Services Electronics Program Grant DAAH04-95-1-0038 National Science Foundation Young Investigator Award Packard Foundation U.S. Navy - Office of Naval Research 2010-07-16T20:35:46Z 2010-07-16T20:35:46Z 1994-01-01 to 1994-12-31 Technical Report RLE_PR_137_01_02s_06 http://hdl.handle.net/1721.1/57302 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1994 Solid State Physics, Electronics and Optics Quantum-Effect Devices Single-Electron Spectroscopy Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 137 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| spellingShingle | Single-Electron Spectroscopy Traps Created by Disorder in Semiconductor Structures Traps Created by Impurities in Semiconductor Structures Artificial Atoms Spatially Resolved Charge Sensing Single-Electron Transistors for Spectroscopy Ashoori, Raymond C. Chan, Ho-Bun Berman, David B. Brodsky, Mikhail G. Heemeyer, Sven Folch, Albert Single-Electron Spectroscopy |
| title | Single-Electron Spectroscopy |
| title_full | Single-Electron Spectroscopy |
| title_fullStr | Single-Electron Spectroscopy |
| title_full_unstemmed | Single-Electron Spectroscopy |
| title_short | Single-Electron Spectroscopy |
| title_sort | single electron spectroscopy |
| topic | Single-Electron Spectroscopy Traps Created by Disorder in Semiconductor Structures Traps Created by Impurities in Semiconductor Structures Artificial Atoms Spatially Resolved Charge Sensing Single-Electron Transistors for Spectroscopy |
| url | http://hdl.handle.net/1721.1/57302 |
| work_keys_str_mv | AT ashooriraymondc singleelectronspectroscopy AT chanhobun singleelectronspectroscopy AT bermandavidb singleelectronspectroscopy AT brodskymikhailg singleelectronspectroscopy AT heemeyersven singleelectronspectroscopy AT folchalbert singleelectronspectroscopy |