Synchrotron X-Ray Studies of Surface Disordering
Contains table of contents for Section 4, an introduction, reports on two research projects and a list of publications.
| Main Authors: | , , , , |
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| Format: | Technical Report |
| Language: | English |
| Published: |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
2010
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| Subjects: | |
| Online Access: | http://hdl.handle.net/1721.1/57343 |
| _version_ | 1826196483801612288 |
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| author | Birgeneau, Robert J. Wells, Barry Ramstad, Monte J. Young, Michael J. Martin, Debra L. |
| author_facet | Birgeneau, Robert J. Wells, Barry Ramstad, Monte J. Young, Michael J. Martin, Debra L. |
| author_sort | Birgeneau, Robert J. |
| collection | MIT |
| description | Contains table of contents for Section 4, an introduction, reports on two research projects and a list of publications. |
| first_indexed | 2024-09-23T10:27:40Z |
| format | Technical Report |
| id | mit-1721.1/57343 |
| institution | Massachusetts Institute of Technology |
| language | English |
| last_indexed | 2024-09-23T10:27:40Z |
| publishDate | 2010 |
| publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| record_format | dspace |
| spelling | mit-1721.1/573432019-04-12T23:58:42Z Synchrotron X-Ray Studies of Surface Disordering Birgeneau, Robert J. Wells, Barry Ramstad, Monte J. Young, Michael J. Martin, Debra L. Synchrotron X-Ray Studies of Surface Disordering Stability of Vicinal Si(111) Surfaces Under Sublimation Stability of Vicinal Si(111) Surfaces Under Electromigration Monolayer Melting Contains table of contents for Section 4, an introduction, reports on two research projects and a list of publications. Joint Services Electronics Program Grant DAAH04-95-1-0038 2010-07-16T21:51:09Z 2010-07-16T21:51:09Z 1995-01-01 to 1995-12-31 Technical Report RLE_PR_138_01_04s_01 http://hdl.handle.net/1721.1/57343 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1995 Solid State Physics, Electronics and Optics Surfaces and Interfaces Synchrotron X-Ray Studies of Surface Disordering Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 138 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| spellingShingle | Synchrotron X-Ray Studies of Surface Disordering Stability of Vicinal Si(111) Surfaces Under Sublimation Stability of Vicinal Si(111) Surfaces Under Electromigration Monolayer Melting Birgeneau, Robert J. Wells, Barry Ramstad, Monte J. Young, Michael J. Martin, Debra L. Synchrotron X-Ray Studies of Surface Disordering |
| title | Synchrotron X-Ray Studies of Surface Disordering |
| title_full | Synchrotron X-Ray Studies of Surface Disordering |
| title_fullStr | Synchrotron X-Ray Studies of Surface Disordering |
| title_full_unstemmed | Synchrotron X-Ray Studies of Surface Disordering |
| title_short | Synchrotron X-Ray Studies of Surface Disordering |
| title_sort | synchrotron x ray studies of surface disordering |
| topic | Synchrotron X-Ray Studies of Surface Disordering Stability of Vicinal Si(111) Surfaces Under Sublimation Stability of Vicinal Si(111) Surfaces Under Electromigration Monolayer Melting |
| url | http://hdl.handle.net/1721.1/57343 |
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