Computer Microvision for Microelectromechanical Systems

Contains table of contents for Section 3 and reports on five research projects.

Detalhes bibliográficos
Principais autores:	Freeman, Dennis M., Troxel, Donald E., McIlrath, Michael B., Aranyosi, Alexander J., Davis, Charles Quentin, Gordon, Michael J., Hong, Stanley S., Huang, Richard Y., Johnson, Laura K., Karu, Zoher Z., Mermelstein, Michael S., Reich, Benjamin D., Pederson, Erik J., Cottrell, Jared D.
Formato:	Technical Report
Idioma:	English
Publicado em:	Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Assuntos:	Computer Microvision for Microelectromechanical Systems Calibration of Fatigue Test Structures Modal Analysis of the Draper Gyroscope Speckle Heterodyne Microscopy Test Studies for Microelectromechanical Systems
Acesso em linha:	http://hdl.handle.net/1721.1/57401

Descrição
Resumo:	Contains table of contents for Section 3 and reports on five research projects.

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