Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors

Contains an introduction, reports on three research projects, research conclusions and a list of publications.

Bibliographic Details
Main Authors: del Alamo, Jesús A., Somerville, Mark H., Ernst, Alexander N., Nici, Kathleen A.
Format: Technical Report
Language:English
Published: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) 2010
Subjects:
Online Access:http://hdl.handle.net/1721.1/57427
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author del Alamo, Jesús A.
Somerville, Mark H.
Ernst, Alexander N.
Nici, Kathleen A.
author_facet del Alamo, Jesús A.
Somerville, Mark H.
Ernst, Alexander N.
Nici, Kathleen A.
author_sort del Alamo, Jesús A.
collection MIT
description Contains an introduction, reports on three research projects, research conclusions and a list of publications.
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institution Massachusetts Institute of Technology
language English
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spelling mit-1721.1/574272019-04-10T16:28:11Z Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors del Alamo, Jesús A. Somerville, Mark H. Ernst, Alexander N. Nici, Kathleen A. Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors New Measurement Technique for On-State Breakdown Voltage On-State Breakdown Physics New Model for On-state Breakdown Voltage Contains an introduction, reports on three research projects, research conclusions and a list of publications. Joint Services Electronics Program Contract DAAHO4-95-1-0038 2010-07-17T01:41:13Z 2010-07-17T01:41:13Z 1997-01-01 to 1997-12-31 Technical Report RLE_PR_140_01_01s_02 http://hdl.handle.net/1721.1/57427 en Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1997 Solid State Physics, Electronics and Optics Materials and Fabrication Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 140 Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. application/pdf Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
spellingShingle Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors
New Measurement Technique for On-State Breakdown Voltage
On-State Breakdown Physics
New Model for On-state Breakdown Voltage
del Alamo, Jesús A.
Somerville, Mark H.
Ernst, Alexander N.
Nici, Kathleen A.
Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors
title Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors
title_full Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors
title_fullStr Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors
title_full_unstemmed Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors
title_short Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors
title_sort physics of inaias ingaas heterostructure field effect transistors
topic Physics of InAIAs/InGaAs Heterostructure Field-Effect Transistors
New Measurement Technique for On-State Breakdown Voltage
On-State Breakdown Physics
New Model for On-state Breakdown Voltage
url http://hdl.handle.net/1721.1/57427
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