Heuristic Techniques in Computer Aided Circuit Analysis
We present EL, a new kind of circuit analysis program. Whereas other circuit analysis systems rely on classical, formal analysis techniques, EL employs heuristic "inspection" methods to solve rather complex DC bias circuits. These techniques also give EL the ability to explain any re...
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Language: | en_US |
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2004
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Online Access: | http://hdl.handle.net/1721.1/5803 |
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author | Sussman, Gerald Jay Stallman, Richard Matthew |
author_facet | Sussman, Gerald Jay Stallman, Richard Matthew |
author_sort | Sussman, Gerald Jay |
collection | MIT |
description | We present EL, a new kind of circuit analysis program. Whereas other circuit analysis systems rely on classical, formal analysis techniques, EL employs heuristic "inspection" methods to solve rather complex DC bias circuits. These techniques also give EL the ability to explain any result in terms of its own qualitative reasoning processes. EL's reasoning is based on the concept of a "local one-step deduction" augmented by various "teleological" principles and by the concept of a "macro-element". We present several annotated examples of EL in operation and an explanation of how it works. We also show how EL can be extended in several directions, including sinusoidal steady state analysis. Finally, we touch on possible implications for engineering education. We feel that EL is significant not only as a novel approach to circuit analysis but also as an application of Artificial Intelligence techniques to a new and interesting domain. |
first_indexed | 2024-09-23T10:38:07Z |
id | mit-1721.1/5803 |
institution | Massachusetts Institute of Technology |
language | en_US |
last_indexed | 2024-09-23T10:38:07Z |
publishDate | 2004 |
record_format | dspace |
spelling | mit-1721.1/58032022-05-19T06:46:33Z Heuristic Techniques in Computer Aided Circuit Analysis Sussman, Gerald Jay Stallman, Richard Matthew We present EL, a new kind of circuit analysis program. Whereas other circuit analysis systems rely on classical, formal analysis techniques, EL employs heuristic "inspection" methods to solve rather complex DC bias circuits. These techniques also give EL the ability to explain any result in terms of its own qualitative reasoning processes. EL's reasoning is based on the concept of a "local one-step deduction" augmented by various "teleological" principles and by the concept of a "macro-element". We present several annotated examples of EL in operation and an explanation of how it works. We also show how EL can be extended in several directions, including sinusoidal steady state analysis. Finally, we touch on possible implications for engineering education. We feel that EL is significant not only as a novel approach to circuit analysis but also as an application of Artificial Intelligence techniques to a new and interesting domain. 2004-10-01T20:37:30Z 2004-10-01T20:37:30Z 1975-03-01 AIM-328 http://hdl.handle.net/1721.1/5803 en_US AIM-328 28 p. 1902299 bytes 1360617 bytes application/postscript application/pdf application/postscript application/pdf |
spellingShingle | Sussman, Gerald Jay Stallman, Richard Matthew Heuristic Techniques in Computer Aided Circuit Analysis |
title | Heuristic Techniques in Computer Aided Circuit Analysis |
title_full | Heuristic Techniques in Computer Aided Circuit Analysis |
title_fullStr | Heuristic Techniques in Computer Aided Circuit Analysis |
title_full_unstemmed | Heuristic Techniques in Computer Aided Circuit Analysis |
title_short | Heuristic Techniques in Computer Aided Circuit Analysis |
title_sort | heuristic techniques in computer aided circuit analysis |
url | http://hdl.handle.net/1721.1/5803 |
work_keys_str_mv | AT sussmangeraldjay heuristictechniquesincomputeraidedcircuitanalysis AT stallmanrichardmatthew heuristictechniquesincomputeraidedcircuitanalysis |