Yield-driven iterative robust circuit optimization algorithm

Yield-driven iterative robust circuit optimization algorithm

This paper proposes an equation-based multi-scenario iterative robust optimization methodology for analog/mixed-signal circuits. We show that due to local circuit performance monotonicity in random variations constraint maximization can be used to efficiently find critical constraints and worst-...

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Bibliographic Details
Main Authors: Li, Yan, Stojanovic, Vladimir Marko
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers 2010
Subjects:
Algorithms
Robust Circuit Optimization
Variability
Yield
Analog Circuits
Online Access:http://hdl.handle.net/1721.1/58966

Internet

http://hdl.handle.net/1721.1/58966

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