Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits

For the first time, we demonstrate control of organic thinfilm transistor's (OTFT) threshold voltage (V [subscript T]) by modifying the gate work function. We present a near-room-temperature, fully lithographic process to fabricate integrated pentacene dual V [subscript T] OTFTs suitable for la...

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Main Authors: Sodini, Charles G., Nausieda, Ivan A., Ryu, Kevin K., He, David Da, Akinwande, Akintunde Ibitayo, Bulovic, Vladimir
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers 2010
Online Access:http://hdl.handle.net/1721.1/60019
https://orcid.org/0000-0003-3001-9223
https://orcid.org/0000-0002-0960-2580
https://orcid.org/0000-0002-0413-8774
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author Sodini, Charles G.
Nausieda, Ivan A.
Ryu, Kevin K.
He, David Da
Akinwande, Akintunde Ibitayo
Bulovic, Vladimir
author2 Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
author_facet Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Sodini, Charles G.
Nausieda, Ivan A.
Ryu, Kevin K.
He, David Da
Akinwande, Akintunde Ibitayo
Bulovic, Vladimir
author_sort Sodini, Charles G.
collection MIT
description For the first time, we demonstrate control of organic thinfilm transistor's (OTFT) threshold voltage (V [subscript T]) by modifying the gate work function. We present a near-room-temperature, fully lithographic process to fabricate integrated pentacene dual V [subscript T] OTFTs suitable for large-area and flexible mixed signal circuits. Platinum and aluminum are used as the gate metals for the high V [subscript T] (more depletion-like) and low V [subscript T] (more enhancement-like) p-channel devices, respectively. The availability of a high V [subscript T] device enables area-efficient zero-VGS current source loads. We demonstrate positive noise margin inverters which use pico Watts of power and a 3 V supply. Compared to a single V [subscript T] implementation, the dual V [subscript T] inverter occupies an area that is 30Ã Â smaller, and is 17Ã Â faster. These results show that p-channel only organic technologies can produce functional and low-power circuits without integrating a complementary device.
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spelling mit-1721.1/600192022-09-29T20:01:16Z Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits Sodini, Charles G. Nausieda, Ivan A. Ryu, Kevin K. He, David Da Akinwande, Akintunde Ibitayo Bulovic, Vladimir Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Microsystems Technology Laboratories Sodini, Charles G. Sodini, Charles G. Nausieda, Ivan A. Ryu, Kevin K. He, David Da Akinwande, Akintunde Ibitayo Bulovic, Vladimir For the first time, we demonstrate control of organic thinfilm transistor's (OTFT) threshold voltage (V [subscript T]) by modifying the gate work function. We present a near-room-temperature, fully lithographic process to fabricate integrated pentacene dual V [subscript T] OTFTs suitable for large-area and flexible mixed signal circuits. Platinum and aluminum are used as the gate metals for the high V [subscript T] (more depletion-like) and low V [subscript T] (more enhancement-like) p-channel devices, respectively. The availability of a high V [subscript T] device enables area-efficient zero-VGS current source loads. We demonstrate positive noise margin inverters which use pico Watts of power and a 3 V supply. Compared to a single V [subscript T] implementation, the dual V [subscript T] inverter occupies an area that is 30Ã Â smaller, and is 17Ã Â faster. These results show that p-channel only organic technologies can produce functional and low-power circuits without integrating a complementary device. Semiconductor Research Corporation. Center for Circuits and Systems Solutions (Contract 2003-CT-888) Martin Family Society of Fellows for Sustainability 2010-11-21T21:48:50Z 2010-11-21T21:48:50Z 2009-12 Article http://purl.org/eprint/type/ConferencePaper 978-1-4244-5639-0 E-ISBN: 978-1-4244-5640-6 INSPEC Accession Number: 11207408 http://hdl.handle.net/1721.1/60019 Nausieda, I. et al. “Dual threshold voltage integrated organic technology for ultralow-power circuits.” Electron Devices Meeting (IEDM), 2009 IEEE International. 2009. 1-4. © 2009, IEEE https://orcid.org/0000-0003-3001-9223 https://orcid.org/0000-0002-0960-2580 https://orcid.org/0000-0002-0413-8774 en_US http://dx.doi.org/10.1109/IEDM.2009.5424345 IEEE International Electron Devices Meeting Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Institute of Electrical and Electronics Engineers IEEE
spellingShingle Sodini, Charles G.
Nausieda, Ivan A.
Ryu, Kevin K.
He, David Da
Akinwande, Akintunde Ibitayo
Bulovic, Vladimir
Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits
title Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits
title_full Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits
title_fullStr Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits
title_full_unstemmed Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits
title_short Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits
title_sort dual threshold voltage integrated organic technology for ultralow power circuits
url http://hdl.handle.net/1721.1/60019
https://orcid.org/0000-0003-3001-9223
https://orcid.org/0000-0002-0960-2580
https://orcid.org/0000-0002-0413-8774
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