The creep rupture behavior of notched bars of IN-X750

The creep rupture behavior of notched bars of IN-X750

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1986.

Bibliographic Details
Main Author: Vasatis, Ioannis Platon
Other Authors: Regis M. Pelloux.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2011
Subjects:
Materials Science and Engineering.
Online Access:http://hdl.handle.net/1721.1/60721

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