Fast scanning two-photon microscopy

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2010.

Bibliographic Details
Main Author: Chang, Jeremy T
Other Authors: Edward S. Boyden.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2011
Subjects:
Online Access:http://hdl.handle.net/1721.1/61148
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author Chang, Jeremy T
author2 Edward S. Boyden.
author_facet Edward S. Boyden.
Chang, Jeremy T
author_sort Chang, Jeremy T
collection MIT
description Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2010.
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spelling mit-1721.1/611482019-04-11T13:42:50Z Fast scanning two-photon microscopy Fast scanning 2-photon microscopy Fast scanning two-photon microscope Chang, Jeremy T Edward S. Boyden. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Electrical Engineering and Computer Science. Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2010. Cataloged from PDF version of thesis. Includes bibliographical references (p. 45-46). Fast scanning two-photon microscopy coupled with the use light activated ion channels provides the basis for fast imaging and stimulation in the characterization of in vivo neural networks. A two-photon microscope capable of fast scanning using acousto-optic deflectors was designed and implemented. The software controller was expanded so that random access scan in three dimensions could be handled, so that algorithms that can identify neurons from images acquired using the two-photon microscope can be developed. Finally the localization of optogenetic Channelrhodopsin-2 channel to the neuron cell body was tested using a ChR2-MBD construct. by Jeremy T Chang. M.Eng. 2011-02-23T14:20:31Z 2011-02-23T14:20:31Z 2010 2010 Thesis http://hdl.handle.net/1721.1/61148 698127201 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 46 p. application/pdf Massachusetts Institute of Technology
spellingShingle Electrical Engineering and Computer Science.
Chang, Jeremy T
Fast scanning two-photon microscopy
title Fast scanning two-photon microscopy
title_full Fast scanning two-photon microscopy
title_fullStr Fast scanning two-photon microscopy
title_full_unstemmed Fast scanning two-photon microscopy
title_short Fast scanning two-photon microscopy
title_sort fast scanning two photon microscopy
topic Electrical Engineering and Computer Science.
url http://hdl.handle.net/1721.1/61148
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