Noise analysis for comparator-based circuits
Noise analysis for comparator-based circuits is presented. The goal is to gain insight into the different sources of noise in these circuits for design purposes. After the general analysis techniques are established, they are applied to different noise sources in the comparator-based switched-capaci...
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| Format: | Article |
| Language: | en_US |
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Institute of Electrical and Electronics Engineers
2011
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| Online Access: | http://hdl.handle.net/1721.1/61660 https://orcid.org/0000-0002-7783-0403 https://orcid.org/0000-0002-0413-8774 |
| _version_ | 1826216963532128256 |
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| author | Sepke, Todd Holloway, Peter Sodini, Charles G. Lee, Hae-Seung |
| author2 | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
| author_facet | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Sepke, Todd Holloway, Peter Sodini, Charles G. Lee, Hae-Seung |
| author_sort | Sepke, Todd |
| collection | MIT |
| description | Noise analysis for comparator-based circuits is presented. The goal is to gain insight into the different sources of noise in these circuits for design purposes. After the general analysis techniques are established, they are applied to different noise sources in the comparator-based switched-capacitor pipeline analog-to-digital converter (ADC). The results show that the noise from the virtual ground threshold detection comparator dominates the overall ADC noise performance. The noise from the charging current can also be significant, depending on the size of the capacitors used, but the contribution was small in the prototype. The other noise sources have contributions comparable to those in op-amp-based designs, and their effects can be managed through appropriate design. In the prototype, folded flicker noise was found to be a significant contributor to the broadband noise because the flicker noise of the comparator extends beyond the Nyquist rate of the converter. |
| first_indexed | 2024-09-23T16:56:17Z |
| format | Article |
| id | mit-1721.1/61660 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T16:56:17Z |
| publishDate | 2011 |
| publisher | Institute of Electrical and Electronics Engineers |
| record_format | dspace |
| spelling | mit-1721.1/616602022-10-03T09:14:34Z Noise analysis for comparator-based circuits Sepke, Todd Holloway, Peter Sodini, Charles G. Lee, Hae-Seung Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Lee, Hae-Seung Lee, Hae-Seung Sodini, Charles G. Sepke, Todd Noise analysis for comparator-based circuits is presented. The goal is to gain insight into the different sources of noise in these circuits for design purposes. After the general analysis techniques are established, they are applied to different noise sources in the comparator-based switched-capacitor pipeline analog-to-digital converter (ADC). The results show that the noise from the virtual ground threshold detection comparator dominates the overall ADC noise performance. The noise from the charging current can also be significant, depending on the size of the capacitors used, but the contribution was small in the prototype. The other noise sources have contributions comparable to those in op-amp-based designs, and their effects can be managed through appropriate design. In the prototype, folded flicker noise was found to be a significant contributor to the broadband noise because the flicker noise of the comparator extends beyond the Nyquist rate of the converter. National Semiconductor Corporation 2011-03-10T21:58:45Z 2011-03-10T21:58:45Z 2009-03 2008-03 Article http://purl.org/eprint/type/ConferencePaper 1549-8328 INSPEC Accession Number: 10543363 http://hdl.handle.net/1721.1/61660 Sepke, T. et al. “Noise Analysis for Comparator-Based Circuits.” Circuits and Systems I: Regular Papers, IEEE Transactions on 56.3 (2009): 541-553. © 2009 IEEE. https://orcid.org/0000-0002-7783-0403 https://orcid.org/0000-0002-0413-8774 en_US http://dx.doi.org/10.1109/TCSI.2008.2002547 IEEE Transactions on Circuits and Systems I: Regular Papers Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf Institute of Electrical and Electronics Engineers IEEE |
| spellingShingle | Sepke, Todd Holloway, Peter Sodini, Charles G. Lee, Hae-Seung Noise analysis for comparator-based circuits |
| title | Noise analysis for comparator-based circuits |
| title_full | Noise analysis for comparator-based circuits |
| title_fullStr | Noise analysis for comparator-based circuits |
| title_full_unstemmed | Noise analysis for comparator-based circuits |
| title_short | Noise analysis for comparator-based circuits |
| title_sort | noise analysis for comparator based circuits |
| url | http://hdl.handle.net/1721.1/61660 https://orcid.org/0000-0002-7783-0403 https://orcid.org/0000-0002-0413-8774 |
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