Highlighted depth-of-field photography: Shining light on focus
We present a photographic method to enhance intensity differences between objects at varying distances from the focal plane. By combining a unique capture procedure with simple image processing techniques, the detected brightness of an object is decreased proportional to its degree of defocus. A...
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Format: | Article |
Language: | en_US |
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Association for Computing Machinery
2011
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Online Access: | http://hdl.handle.net/1721.1/66082 https://orcid.org/0000-0002-2480-9141 https://orcid.org/0000-0002-3254-3224 |
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author | Kim, Jaewon Horstmeyer, Roarke William Kim, Ig-Jae Raskar, Ramesh |
author2 | Massachusetts Institute of Technology. Media Laboratory |
author_facet | Massachusetts Institute of Technology. Media Laboratory Kim, Jaewon Horstmeyer, Roarke William Kim, Ig-Jae Raskar, Ramesh |
author_sort | Kim, Jaewon |
collection | MIT |
description | We present a photographic method to enhance intensity differences between
objects at varying distances from the focal plane. By combining a unique
capture procedure with simple image processing techniques, the detected
brightness of an object is decreased proportional to its degree of defocus. A
camera-projector system casts distinct grid patterns onto a scene to generate
a spatial distribution of point reflections. These point reflections relay a
relative measure of defocus that is utilized in postprocessing to generate a
highlighted DOF photograph. Trade-offs between three different projectorprocessing
pairs are analyzed, and a model is developed to help describe a
new intensity-dependent depth of field that is controlled by the pattern of
illumination. Results are presented for a primary single snapshot design as
well as a scanning method and a comparison method. As an application,
automatic matting results are presented. |
first_indexed | 2024-09-23T08:57:03Z |
format | Article |
id | mit-1721.1/66082 |
institution | Massachusetts Institute of Technology |
language | en_US |
last_indexed | 2024-09-23T08:57:03Z |
publishDate | 2011 |
publisher | Association for Computing Machinery |
record_format | dspace |
spelling | mit-1721.1/660822022-09-26T09:24:05Z Highlighted depth-of-field photography: Shining light on focus Kim, Jaewon Horstmeyer, Roarke William Kim, Ig-Jae Raskar, Ramesh Massachusetts Institute of Technology. Media Laboratory Program in Media Arts and Sciences (Massachusetts Institute of Technology) Raskar, Ramesh Kim, Jaewon Horstmeyer, Roarke William Kim, Ig-Jae Raskar, Ramesh We present a photographic method to enhance intensity differences between objects at varying distances from the focal plane. By combining a unique capture procedure with simple image processing techniques, the detected brightness of an object is decreased proportional to its degree of defocus. A camera-projector system casts distinct grid patterns onto a scene to generate a spatial distribution of point reflections. These point reflections relay a relative measure of defocus that is utilized in postprocessing to generate a highlighted DOF photograph. Trade-offs between three different projectorprocessing pairs are analyzed, and a model is developed to help describe a new intensity-dependent depth of field that is controlled by the pattern of illumination. Results are presented for a primary single snapshot design as well as a scanning method and a comparison method. As an application, automatic matting results are presented. Alfred P. Sloan Foundation 2011-09-27T19:37:52Z 2011-09-27T19:37:52Z 2011-05 Article http://purl.org/eprint/type/JournalArticle 0730-0301 http://hdl.handle.net/1721.1/66082 Kim, Jaewon et al. “Highlighted depth-of-field photography: shining light on focus.” ACM Transactions on Graphics 30, 3, (May 2011): 1-9. Copyright © 2011, Association for Computing Machinery, Inc. https://orcid.org/0000-0002-2480-9141 https://orcid.org/0000-0002-3254-3224 en_US http://dx.doi.org/10.1145/1966394.1966403 ACM transactions on graphics Creative Commons Attribution-Noncommercial-Share Alike 3.0 http://creativecommons.org/licenses/by-nc-sa/3.0/ application/pdf Association for Computing Machinery MIT web domain |
spellingShingle | Kim, Jaewon Horstmeyer, Roarke William Kim, Ig-Jae Raskar, Ramesh Highlighted depth-of-field photography: Shining light on focus |
title | Highlighted depth-of-field photography: Shining light on focus |
title_full | Highlighted depth-of-field photography: Shining light on focus |
title_fullStr | Highlighted depth-of-field photography: Shining light on focus |
title_full_unstemmed | Highlighted depth-of-field photography: Shining light on focus |
title_short | Highlighted depth-of-field photography: Shining light on focus |
title_sort | highlighted depth of field photography shining light on focus |
url | http://hdl.handle.net/1721.1/66082 https://orcid.org/0000-0002-2480-9141 https://orcid.org/0000-0002-3254-3224 |
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