Surface-wave eikonal tomography in a scattering environment
Surface waves are of increasing interest in seismic prospecting. Traveltime tomography based on dispersion measurements is often used to process surface-wave data, but it has limitations due to the a priori information it requires. The surface-wave eikonal tomography proposed here does not require...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Technical Report |
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Massachusetts Institute of Technology. Earth Resources Laboratory
2012
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| Online Access: | http://hdl.handle.net/1721.1/68584 |
| _version_ | 1811079222888759296 |
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| author | Verdel, Arie Gouedard, Pierre Yao, Huajian van der Hilst, Robert D. |
| author2 | Massachusetts Institute of Technology. Earth Resources Laboratory |
| author_facet | Massachusetts Institute of Technology. Earth Resources Laboratory Verdel, Arie Gouedard, Pierre Yao, Huajian van der Hilst, Robert D. |
| author_sort | Verdel, Arie |
| collection | MIT |
| description | Surface waves are of increasing interest in seismic prospecting. Traveltime tomography based on
dispersion measurements is often used to process surface-wave data, but it has limitations due to the
a priori information it requires. The surface-wave eikonal tomography proposed here does not require
such a priori information. In complex scattering environments, picking arrivals is difficult because the
waveforms are complicated. Working in narrow frequency bands makes it even more difficult as it spreads
arrivals in time and introduces overlap. We present here a neighborhood-based cross-correlation picking
method that overcomes this difficulty, which then allows for reliable calculation of 2D phase-velocity
variation through the eikonal equation. |
| first_indexed | 2024-09-23T11:11:48Z |
| format | Technical Report |
| id | mit-1721.1/68584 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T11:11:48Z |
| publishDate | 2012 |
| publisher | Massachusetts Institute of Technology. Earth Resources Laboratory |
| record_format | dspace |
| spelling | mit-1721.1/685842019-04-10T13:15:56Z Surface-wave eikonal tomography in a scattering environment Verdel, Arie Gouedard, Pierre Yao, Huajian van der Hilst, Robert D. Massachusetts Institute of Technology. Earth Resources Laboratory Gouedard, Pierre Yao, Huajian van der Hilst, Robert D. Scattering Tomography Surface waves are of increasing interest in seismic prospecting. Traveltime tomography based on dispersion measurements is often used to process surface-wave data, but it has limitations due to the a priori information it requires. The surface-wave eikonal tomography proposed here does not require such a priori information. In complex scattering environments, picking arrivals is difficult because the waveforms are complicated. Working in narrow frequency bands makes it even more difficult as it spreads arrivals in time and introduces overlap. We present here a neighborhood-based cross-correlation picking method that overcomes this difficulty, which then allows for reliable calculation of 2D phase-velocity variation through the eikonal equation. 2012-01-13T20:04:57Z 2012-01-13T20:04:57Z 2010 Technical Report http://hdl.handle.net/1721.1/68584 Earth Resources Laboratory Industry Consortia Annual Report;2010-09 application/pdf Massachusetts Institute of Technology. Earth Resources Laboratory |
| spellingShingle | Scattering Tomography Verdel, Arie Gouedard, Pierre Yao, Huajian van der Hilst, Robert D. Surface-wave eikonal tomography in a scattering environment |
| title | Surface-wave eikonal tomography in a scattering environment |
| title_full | Surface-wave eikonal tomography in a scattering environment |
| title_fullStr | Surface-wave eikonal tomography in a scattering environment |
| title_full_unstemmed | Surface-wave eikonal tomography in a scattering environment |
| title_short | Surface-wave eikonal tomography in a scattering environment |
| title_sort | surface wave eikonal tomography in a scattering environment |
| topic | Scattering Tomography |
| url | http://hdl.handle.net/1721.1/68584 |
| work_keys_str_mv | AT verdelarie surfacewaveeikonaltomographyinascatteringenvironment AT gouedardpierre surfacewaveeikonaltomographyinascatteringenvironment AT yaohuajian surfacewaveeikonaltomographyinascatteringenvironment AT vanderhilstrobertd surfacewaveeikonaltomographyinascatteringenvironment |