Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths
Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for m...
| Main Authors: | , , , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
American Physical Society (APS)
2012
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| Online Access: | http://hdl.handle.net/1721.1/68676 https://orcid.org/0000-0001-8492-2261 https://orcid.org/0000-0002-3968-8530 https://orcid.org/0000-0001-7804-5418 https://orcid.org/0000-0001-9157-6491 |
| Summary: | Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for most materials. Here, we introduce the first experimental technique which can measure MFP distributions over a wide range of length scales and materials. Using this technique, we measure the MFP distribution of silicon for the first time and obtain good agreement with first-principles calculations. |
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