Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths
Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for m...
| Main Authors: | , , , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
American Physical Society (APS)
2012
|
| Online Access: | http://hdl.handle.net/1721.1/68676 https://orcid.org/0000-0001-8492-2261 https://orcid.org/0000-0002-3968-8530 https://orcid.org/0000-0001-7804-5418 https://orcid.org/0000-0001-9157-6491 |
| _version_ | 1826214093535576064 |
|---|---|
| author | Schmidt, A. J. Minnich, Austin Jerome Johnson, Jeremiah A. Esfarjani, Keivan Dresselhaus, Mildred Nelson, Keith Adam Chen, Gang |
| author2 | Massachusetts Institute of Technology. Department of Chemistry |
| author_facet | Massachusetts Institute of Technology. Department of Chemistry Schmidt, A. J. Minnich, Austin Jerome Johnson, Jeremiah A. Esfarjani, Keivan Dresselhaus, Mildred Nelson, Keith Adam Chen, Gang |
| author_sort | Schmidt, A. J. |
| collection | MIT |
| description | Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for most materials. Here, we introduce the first experimental technique which can measure MFP distributions over a wide range of length scales and materials. Using this technique, we measure the MFP distribution of silicon for the first time and obtain good agreement with first-principles calculations. |
| first_indexed | 2024-09-23T15:59:42Z |
| format | Article |
| id | mit-1721.1/68676 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T15:59:42Z |
| publishDate | 2012 |
| publisher | American Physical Society (APS) |
| record_format | dspace |
| spelling | mit-1721.1/686762022-10-02T05:36:22Z Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths Schmidt, A. J. Minnich, Austin Jerome Johnson, Jeremiah A. Esfarjani, Keivan Dresselhaus, Mildred Nelson, Keith Adam Chen, Gang Massachusetts Institute of Technology. Department of Chemistry Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology. Department of Mechanical Engineering Chen, Gang Minnich, Austin Jerome Johnson, Jeremiah A. Esfarjani, Keivan Dresselhaus, Mildred Nelson, Keith Adam Chen, Gang Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for most materials. Here, we introduce the first experimental technique which can measure MFP distributions over a wide range of length scales and materials. Using this technique, we measure the MFP distribution of silicon for the first time and obtain good agreement with first-principles calculations. United States. Dept. of Energy. Office of Basic Energy Sciences (Grant No. DE-SC0001299/DE-FG02-09ER46577) Center for Clean Water and Clean Energy at MIT and KFUPM National Science Foundation (U.S.) 2012-01-27T18:08:05Z 2012-01-27T18:08:05Z 2011-08 2011-05 Article http://purl.org/eprint/type/JournalArticle 0031-9007 1079-7114 http://hdl.handle.net/1721.1/68676 Minnich, A. et al. “Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths.” Physical Review Letters 107.9 (2011): n. pag. Web. 27 Jan. 2012. © 2011 American Physical Society https://orcid.org/0000-0001-8492-2261 https://orcid.org/0000-0002-3968-8530 https://orcid.org/0000-0001-7804-5418 https://orcid.org/0000-0001-9157-6491 en_US http://dx.doi.org/10.1103/PhysRevLett.107.095901 Physical Review Letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society (APS) APS |
| spellingShingle | Schmidt, A. J. Minnich, Austin Jerome Johnson, Jeremiah A. Esfarjani, Keivan Dresselhaus, Mildred Nelson, Keith Adam Chen, Gang Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths |
| title | Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths |
| title_full | Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths |
| title_fullStr | Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths |
| title_full_unstemmed | Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths |
| title_short | Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths |
| title_sort | thermal conductivity spectroscopy technique to measure phonon mean free paths |
| url | http://hdl.handle.net/1721.1/68676 https://orcid.org/0000-0001-8492-2261 https://orcid.org/0000-0002-3968-8530 https://orcid.org/0000-0001-7804-5418 https://orcid.org/0000-0001-9157-6491 |
| work_keys_str_mv | AT schmidtaj thermalconductivityspectroscopytechniquetomeasurephononmeanfreepaths AT minnichaustinjerome thermalconductivityspectroscopytechniquetomeasurephononmeanfreepaths AT johnsonjeremiaha thermalconductivityspectroscopytechniquetomeasurephononmeanfreepaths AT esfarjanikeivan thermalconductivityspectroscopytechniquetomeasurephononmeanfreepaths AT dresselhausmildred thermalconductivityspectroscopytechniquetomeasurephononmeanfreepaths AT nelsonkeithadam thermalconductivityspectroscopytechniquetomeasurephononmeanfreepaths AT chengang thermalconductivityspectroscopytechniquetomeasurephononmeanfreepaths |