Leakage-resilient coin tossing

Proceedings 25th International Symposium, DISC 2011, Rome, Italy, September 20-22, 2011.

Bibliographic Details
Main Authors: Boyle, Elette, Goldwasser, Shafi
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format: Book chapter
Language:en_US
Published: Spring Berlin/Heidelberg 2012
Online Access:http://hdl.handle.net/1721.1/71675
https://orcid.org/0000-0003-4728-1535