A Self-Aligned InGaAs HEMT Architecture for Logic Applications
In this paper, we present a novel self-aligned process for future III-V logic FETs. Using this process, we have demonstrated enhancement-mode 90-nm-gate-length InGaAs HEMTs with excellent logic figures of merit. We have carried out a detailed analysis of this device architecture to determine its fut...
Główni autorzy: | Waldron, Niamh, Kim, Dae-Hyun, del Alamo, Jesus A. |
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Kolejni autorzy: | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
Format: | Artykuł |
Język: | en_US |
Wydane: |
Institute of Electrical and Electronics Engineers (IEEE)
2012
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Dostęp online: | http://hdl.handle.net/1721.1/71795 |
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