Certified Rapid Solution of Parametrized Linear Elliptic Equations: Application to Parameter Estimation

Certified Rapid Solution of Parametrized Linear Elliptic Equations: Application to Parameter Estimation

We present a technique for the rapid and reliable evaluation of linear-functional output of elliptic partial differential equations with affine parameter dependence. The essential components are (i) rapidly uniformly convergent reduced-basis approximations — Galerkin projection onto a space WN span...

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Bibliographic Details
Main Authors: Nguyen, N. C., Liu, Guirong, Patera, Anthony T.
Format: Article
Language:English
Published: 2004
Subjects:
Linear elliptic equations
Reduced-basis method
Reduced-basis approximation
A posteriori error estimation
Parameter estimation
Inverse computational method
Possibility region
Online Access:http://hdl.handle.net/1721.1/7375

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