Loading of a surface-electrode ion trap from a remote, precooled source
We demonstrate loading of ions into a surface-electrode trap (SET) from a remote, laser-cooled source of neutral atoms. We first cool and load ∼10[superscript 6] neutral [superscript 88]Sr atoms into a magneto-optical trap from an oven that has no line of sight with the SET. The cold atoms are then...
| Main Authors: | , , |
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| Format: | Article |
| Language: | en_US |
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American Physical Society
2012
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| Online Access: | http://hdl.handle.net/1721.1/73869 |
| _version_ | 1826188896547897344 |
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| author | Sage, Jeremy M. Kerman, Andrew J. Chiaverini, John |
| author2 | Lincoln Laboratory |
| author_facet | Lincoln Laboratory Sage, Jeremy M. Kerman, Andrew J. Chiaverini, John |
| author_sort | Sage, Jeremy M. |
| collection | MIT |
| description | We demonstrate loading of ions into a surface-electrode trap (SET) from a remote, laser-cooled source of neutral atoms. We first cool and load ∼10[superscript 6] neutral [superscript 88]Sr atoms into a magneto-optical trap from an oven that has no line of sight with the SET. The cold atoms are then pushed with a resonant laser into the trap region where they are subsequently photoionized and trapped in an SET operated at a cryogenic temperature of 4.6 K. We present studies of the loading process and show that our technique achieves ion loading into a shallow (15 meV depth) trap at rates as high as 125 ions/s while drastically reducing the amount of metal deposition on the trap surface as compared with direct loading from a hot vapor. Furthermore, we note that due to multiple stages of isotopic filtering in our loading process, this technique has the potential for enhanced isotopic selectivity over other loading methods. Rapid loading from a clean, isotopically pure, and precooled source may enable scalable quantum-information processing with trapped ions in large, low-depth surface-trap arrays that are not amenable to loading from a hot atomic beam. |
| first_indexed | 2024-09-23T08:06:42Z |
| format | Article |
| id | mit-1721.1/73869 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T08:06:42Z |
| publishDate | 2012 |
| publisher | American Physical Society |
| record_format | dspace |
| spelling | mit-1721.1/738692022-09-30T07:34:17Z Loading of a surface-electrode ion trap from a remote, precooled source Sage, Jeremy M. Kerman, Andrew J. Chiaverini, John Lincoln Laboratory Sage, Jeremy M. Kerman, Andrew J. Chiaverini, John We demonstrate loading of ions into a surface-electrode trap (SET) from a remote, laser-cooled source of neutral atoms. We first cool and load ∼10[superscript 6] neutral [superscript 88]Sr atoms into a magneto-optical trap from an oven that has no line of sight with the SET. The cold atoms are then pushed with a resonant laser into the trap region where they are subsequently photoionized and trapped in an SET operated at a cryogenic temperature of 4.6 K. We present studies of the loading process and show that our technique achieves ion loading into a shallow (15 meV depth) trap at rates as high as 125 ions/s while drastically reducing the amount of metal deposition on the trap surface as compared with direct loading from a hot vapor. Furthermore, we note that due to multiple stages of isotopic filtering in our loading process, this technique has the potential for enhanced isotopic selectivity over other loading methods. Rapid loading from a clean, isotopically pure, and precooled source may enable scalable quantum-information processing with trapped ions in large, low-depth surface-trap arrays that are not amenable to loading from a hot atomic beam. United States. Air Force (Contract FA8721-05-C-0002) 2012-10-10T19:29:49Z 2012-10-10T19:29:49Z 2012-07 2012-05 Article http://purl.org/eprint/type/JournalArticle 1050-2947 1094-1622 http://hdl.handle.net/1721.1/73869 Sage, Jeremy, Andrew Kerman, and John Chiaverini. “Loading of a Surface-electrode Ion Trap from a Remote, Precooled Source.” Physical Review A 86.1 (2012). ©2012 American Physical Society en_US http://dx.doi.org/10.1103/PhysRevA.86.013417 Physical Review A Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Physical Society APS |
| spellingShingle | Sage, Jeremy M. Kerman, Andrew J. Chiaverini, John Loading of a surface-electrode ion trap from a remote, precooled source |
| title | Loading of a surface-electrode ion trap from a remote, precooled source |
| title_full | Loading of a surface-electrode ion trap from a remote, precooled source |
| title_fullStr | Loading of a surface-electrode ion trap from a remote, precooled source |
| title_full_unstemmed | Loading of a surface-electrode ion trap from a remote, precooled source |
| title_short | Loading of a surface-electrode ion trap from a remote, precooled source |
| title_sort | loading of a surface electrode ion trap from a remote precooled source |
| url | http://hdl.handle.net/1721.1/73869 |
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