Observation of thermal occupation of room-temperature J-aggregate microcavity exciton-polaritons
We present a measurement of the lower-branch exciton-polariton occupation in room-temperature J-aggregate microcavity devices under low-density steady-state excitation. The observed occupation follows a Maxwell-Boltzmann distribution at T=300K, indicating efficient polariton relaxation, necessary fo...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Institute of Electrical and Electronics Engineers (IEEE)
2012
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| Online Access: | http://hdl.handle.net/1721.1/74096 https://orcid.org/0000-0002-0960-2580 |